A photoelectric type tunable frequency probe for near-field EMI measurement

Abstract

The accurate measurement of near-field EMI of Printed circuit board (PCB) and electronic equipment is essential nowadays. The photoelectric type probe could provide a better solution to the near-field measurement. In this paper, a combined with copper-clad laminate and electron component, the strip line embedded into PCB basal lamina is designed to get a specific frequency response. However, in consideration of the spatial electro-magnetic disturbance and the high-frequency harmonic jamming from the power supply to the probe, a photoelectric type power supply is proposed to make the power tunable. a structure of the strip line is simulated and analyzed. By changing the value of the patch capacitance between the strip line and the copper-clad laminate, three fixed resonance frequency points are located at 327.046MHz, 1.699GHz and 2.439GHz. The probe proposed in this paper can be widely used in near-field EMI testing.