Pub Date : 2016-07-28DOI: 10.1109/APEMC.2016.7522993
Yang Zi-mu, Zhang Hou, Zhang Leiming, Wang An
A novel dual band antenna with two U-shaped slots is presented. Using two U-shaped slots, the dual band characteristics are obtained. Utilizing a CPW feeding line, the overall dimension of the antenna is 34.5mm× 40mm, which printed on an FR4 substrate with a dielectric constant of 2.95 and a substrate thickness of 0.8 mm. Simulation and measurement results show that the antenna impedance bandwidth covers the frequency range of 2.15 to 3.72GHz. With almost omni-directional radiation pattern, the proposed antenna configuration can be applied to WLAN and WiMAX devices.
{"title":"A U-shaped slot antenna for WLAN and WiMAX applications","authors":"Yang Zi-mu, Zhang Hou, Zhang Leiming, Wang An","doi":"10.1109/APEMC.2016.7522993","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522993","url":null,"abstract":"A novel dual band antenna with two U-shaped slots is presented. Using two U-shaped slots, the dual band characteristics are obtained. Utilizing a CPW feeding line, the overall dimension of the antenna is 34.5mm× 40mm, which printed on an FR4 substrate with a dielectric constant of 2.95 and a substrate thickness of 0.8 mm. Simulation and measurement results show that the antenna impedance bandwidth covers the frequency range of 2.15 to 3.72GHz. With almost omni-directional radiation pattern, the proposed antenna configuration can be applied to WLAN and WiMAX devices.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"154 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131832035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-28DOI: 10.1109/APEMC.2016.7522946
Zhuo-Xian Liang, Hao Xie, Yang Guo, Jian Wang, E. Li, W. Yin
An improved hybrid leapfrog ADI-FDTD method is developed for accurately characterizing complex electromagnetic environment effects (E3) on a warship with multi-wire antennas in this paper. It has the capabilities for fast extracting mutual couplings (S-parameters) among different wire antennas as well as capturing induced current and electric field distributions on such an electrically large platform. All these information will be very important for controlling and suppressing (non) intentional electromagnetic interference (IEMI) on most high-speed data-link communication systems operating at UHF/VHF bands or even higher frequencies.
{"title":"Improved hybrid leapfrog ADI-FDTD method for simulating complex electromagnetic environment effects (E3) on a warship with multi-wire antennas","authors":"Zhuo-Xian Liang, Hao Xie, Yang Guo, Jian Wang, E. Li, W. Yin","doi":"10.1109/APEMC.2016.7522946","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522946","url":null,"abstract":"An improved hybrid leapfrog ADI-FDTD method is developed for accurately characterizing complex electromagnetic environment effects (E3) on a warship with multi-wire antennas in this paper. It has the capabilities for fast extracting mutual couplings (S-parameters) among different wire antennas as well as capturing induced current and electric field distributions on such an electrically large platform. All these information will be very important for controlling and suppressing (non) intentional electromagnetic interference (IEMI) on most high-speed data-link communication systems operating at UHF/VHF bands or even higher frequencies.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123161594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-28DOI: 10.1109/APEMC.2016.7522862
Yinglei Ren, Kai Xiao, Nan Kang, Lumin Zhang, Dan Liu, Y. L. Li
As integrated circuit (IC) chips keep growing in size, I/O data rates and complexity, electrical margin left on printed circuit board (PCB) gets smaller. Mid-loss or even low-loss material may be needed in more cases to meet high speed (HS) signal routing length requests, which leads to cost-adder on PCB. This submission introduces analysis flow as well as practical methods targeting reducing PCB material cost through SI architecture optimization. Following the analysis flow, board designers can get better opportunity of using cheaper material without sacrificing performance.
{"title":"SI architecture optimized high speed serial design for PCB cost saving","authors":"Yinglei Ren, Kai Xiao, Nan Kang, Lumin Zhang, Dan Liu, Y. L. Li","doi":"10.1109/APEMC.2016.7522862","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522862","url":null,"abstract":"As integrated circuit (IC) chips keep growing in size, I/O data rates and complexity, electrical margin left on printed circuit board (PCB) gets smaller. Mid-loss or even low-loss material may be needed in more cases to meet high speed (HS) signal routing length requests, which leads to cost-adder on PCB. This submission introduces analysis flow as well as practical methods targeting reducing PCB material cost through SI architecture optimization. Following the analysis flow, board designers can get better opportunity of using cheaper material without sacrificing performance.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123482446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-28DOI: 10.1109/APEMC.2016.7523007
Wang Li-ye, Wang Li-fang, Li Cheng-lin, Zhan Zhi-gang, Zhu Qing-wei
In this paper, the principle of a Contactless Power Transfer (CPT) system is introduced, the situation of CPT system for electric vehicle about excessive startup current, coil short, system overheating and load open circuit are analyzed and research. According to the actual operating conditions of CPT system may exist fault, ready to power on protection strategy, the short circuit protection strategy, over heat protection strategy and open circuit protection strategy is presented. Experimental results show that these protection strategies are very important for the safety of CPT system.
{"title":"Fault analysis and protection strategy on Contactless Power Transfer system for electric vehicle","authors":"Wang Li-ye, Wang Li-fang, Li Cheng-lin, Zhan Zhi-gang, Zhu Qing-wei","doi":"10.1109/APEMC.2016.7523007","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7523007","url":null,"abstract":"In this paper, the principle of a Contactless Power Transfer (CPT) system is introduced, the situation of CPT system for electric vehicle about excessive startup current, coil short, system overheating and load open circuit are analyzed and research. According to the actual operating conditions of CPT system may exist fault, ready to power on protection strategy, the short circuit protection strategy, over heat protection strategy and open circuit protection strategy is presented. Experimental results show that these protection strategies are very important for the safety of CPT system.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124056823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-05-20DOI: 10.1109/APEMC.2016.7523034
I. Setiawan, C. Keyer, M. Azpúrua, Ferran Silva, F. Leferink
Conducted interference caused by equipment connected to power supply networks, and the interference in these networks, is conventionally measured using (slow) scanning tuned electromagnetic interference (EMI) receivers. A voltage sensor which separates common mode and differential mode in a three-phase setup combined with a 8-channel digital oscilloscope allows measuring voltage and current via many samples in the three phases plus neutral. Using fast fourier transform for the data processing the conventional amplitude-as-function-of-frequency plots, similar to what would be obtained using conventional EMI receivers, can be generated. But with the presented measurement technique it is also possible to present time-frequency plots in a waterfall diagram. The time - domain measurement technique shows that the conducted noise is cyclic short-time interference.
{"title":"Time-domain measurement technique to analyze cyclic short-time interference in power supply networks","authors":"I. Setiawan, C. Keyer, M. Azpúrua, Ferran Silva, F. Leferink","doi":"10.1109/APEMC.2016.7523034","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7523034","url":null,"abstract":"Conducted interference caused by equipment connected to power supply networks, and the interference in these networks, is conventionally measured using (slow) scanning tuned electromagnetic interference (EMI) receivers. A voltage sensor which separates common mode and differential mode in a three-phase setup combined with a 8-channel digital oscilloscope allows measuring voltage and current via many samples in the three phases plus neutral. Using fast fourier transform for the data processing the conventional amplitude-as-function-of-frequency plots, similar to what would be obtained using conventional EMI receivers, can be generated. But with the presented measurement technique it is also possible to present time-frequency plots in a waterfall diagram. The time - domain measurement technique shows that the conducted noise is cyclic short-time interference.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132443937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-05-19DOI: 10.1109/APEMC.2016.7522892
Dwi Mandaris, N. Moonen, S. van de Beek, F. Buesink, F. Leferink
This paper describes a technique to characterize the performance of a Fully Anechoic Chamber (FAC) from 500 MHz to 3 GHz based on S-Parameter analysis with antennas and a Vector Network Analyzer (VNA. The measurements have been performed by placing one antenna inside the chamber and performing S11 reflection analyses in the frequency domain. Via Inverse Fast Fourier Transformation (IFFT) the reflections in the time domain have been analyzed. Also, experiments where S21 transmission loss is measured by putting 2 antennas at different locations have been performed. One antenna is omnidirectional while the other is directional and measurements have been performed in the frequency domain using the VNA. The results are transformed to time domain using the IFFT and time gating is applied to identify the direct and reflected signals, resulting in the so-called site-Voltage Standing Wave Ratio (sVSWR). This sVSWR method enables the analysis of the reflected wave, or imperfection of the chamber. The measurement results show that the chamber has good performance.
{"title":"Validation of a Fully Anechoic Chamber","authors":"Dwi Mandaris, N. Moonen, S. van de Beek, F. Buesink, F. Leferink","doi":"10.1109/APEMC.2016.7522892","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522892","url":null,"abstract":"This paper describes a technique to characterize the performance of a Fully Anechoic Chamber (FAC) from 500 MHz to 3 GHz based on S-Parameter analysis with antennas and a Vector Network Analyzer (VNA. The measurements have been performed by placing one antenna inside the chamber and performing S11 reflection analyses in the frequency domain. Via Inverse Fast Fourier Transformation (IFFT) the reflections in the time domain have been analyzed. Also, experiments where S21 transmission loss is measured by putting 2 antennas at different locations have been performed. One antenna is omnidirectional while the other is directional and measurements have been performed in the frequency domain using the VNA. The results are transformed to time domain using the IFFT and time gating is applied to identify the direct and reflected signals, resulting in the so-called site-Voltage Standing Wave Ratio (sVSWR). This sVSWR method enables the analysis of the reflected wave, or imperfection of the chamber. The measurement results show that the chamber has good performance.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130631091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-05-19DOI: 10.1109/APEMC.2016.7523002
N. Moonen, F. Buesink, F. Leferink
Predicting high frequency behavior of systems with equivalent circuit simulations that are including component self-parasitic effects are not sufficiently accurate anymore. Mutual coupling, which is highly dependent on component/traces placement and orientation, has to be included in circuit models. Predicting the impact can be performed using 3D electromagnetic field simulations, but these are complex and time consuming. This paper suggest extracting the mutual coupling parameters from a parametric 3D model. The lumped elements, which represent the mutual coupling via the electromagnetic field, are back-annotated in the equivalent circuit model. Then circuit simulations can be performed very fast and the impact of the mutual coupling can be determined.
{"title":"Enhanced circuit simulation using mutual coupling parameters obtained via 3D field extraction","authors":"N. Moonen, F. Buesink, F. Leferink","doi":"10.1109/APEMC.2016.7523002","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7523002","url":null,"abstract":"Predicting high frequency behavior of systems with equivalent circuit simulations that are including component self-parasitic effects are not sufficiently accurate anymore. Mutual coupling, which is highly dependent on component/traces placement and orientation, has to be included in circuit models. Predicting the impact can be performed using 3D electromagnetic field simulations, but these are complex and time consuming. This paper suggest extracting the mutual coupling parameters from a parametric 3D model. The lumped elements, which represent the mutual coupling via the electromagnetic field, are back-annotated in the equivalent circuit model. Then circuit simulations can be performed very fast and the impact of the mutual coupling can be determined.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116355652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-05-18DOI: 10.1109/APEMC.2016.7522751
C. Ghfiri, A. Durier, A. Boyer, S. Ben Dhia, C. Marot
This paper describes the construction flow and the validation of an equivalent conducted emission model of a complex integrated circuit (a FPGA), based on the ICEM (Integrated Circuit Emission Model) modeling approach.
本文介绍了基于集成电路发射模型(ICEM)建模方法的复杂集成电路等效传导发射模型的构建流程和验证。
{"title":"Construction of an Integrated Circuit Emission Model of a FPGA","authors":"C. Ghfiri, A. Durier, A. Boyer, S. Ben Dhia, C. Marot","doi":"10.1109/APEMC.2016.7522751","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522751","url":null,"abstract":"This paper describes the construction flow and the validation of an equivalent conducted emission model of a complex integrated circuit (a FPGA), based on the ICEM (Integrated Circuit Emission Model) modeling approach.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123411466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-05-18DOI: 10.1109/APEMC.2016.7522742
A. Durier, A. Boyer, G. Duchamp
The industries of transportation as the space industry are faced with a strong global economic competition which sets economic constraints on the cost of the functions. The use of COTS (Commercial Off-The-Shelf) components in embedded systems is more and more necessary to shorten the development cycles and reduce manufacturing costs. The application of electronic components comes overwhelmingly from public sectors whose requirement is to provide, in short development cycles, technological innovations including risk and cost mitigation. These development cycles must incorporate the specific constraints of embedded systems which are subject to strong normative requirements in terms of robustness and especially in terms of ElectroMagnetic Compatibility (EMC). In order to anticipate the risk of EMC non-compliance at electronic equipment level, the use of simulation tools and the development of EMC components models particularly at Integrated Circuits level has grown in recent years.
{"title":"A methodologic project to characterize and model COTS components EMC behavior after ageing","authors":"A. Durier, A. Boyer, G. Duchamp","doi":"10.1109/APEMC.2016.7522742","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522742","url":null,"abstract":"The industries of transportation as the space industry are faced with a strong global economic competition which sets economic constraints on the cost of the functions. The use of COTS (Commercial Off-The-Shelf) components in embedded systems is more and more necessary to shorten the development cycles and reduce manufacturing costs. The application of electronic components comes overwhelmingly from public sectors whose requirement is to provide, in short development cycles, technological innovations including risk and cost mitigation. These development cycles must incorporate the specific constraints of embedded systems which are subject to strong normative requirements in terms of robustness and especially in terms of ElectroMagnetic Compatibility (EMC). In order to anticipate the risk of EMC non-compliance at electronic equipment level, the use of simulation tools and the development of EMC components models particularly at Integrated Circuits level has grown in recent years.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116478343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-05-18DOI: 10.1109/APEMC.2016.7522794
A. Boyer
Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.
{"title":"Improving spatial resolution of immunity maps by post-processing","authors":"A. Boyer","doi":"10.1109/APEMC.2016.7522794","DOIUrl":"https://doi.org/10.1109/APEMC.2016.7522794","url":null,"abstract":"Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"39 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132497567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：