CCSTG: an efficient test pattern generator for sequential circuits

Abstract

A simple method which combines the efficiencies of an event driven implication method and speed of a compiled code implication is proposed for use in a sequential test pattern generator. This method, in conjunction with several other concepts and heuristics, is used to implement a sequential test pattern generator CCSTG based on the sequential test generation algorithm used in FASTEST. It is shown that the performance of a sequential test pattern generator improves substantially when methods proposed in this paper are incorporated in a test pattern generator. The authors verified this assertion by comparing the performances of test pattern generators, with and without these features, for ISCAS-89 benchmark sequential circuits.<>