{"title":"Reliability of optoelectronic devices for fiber optic communications","authors":"L. Chiu, K. Li, D. Pendse, H.C. Lee, C. Fern","doi":"10.1109/ARMS.1990.67954","DOIUrl":null,"url":null,"abstract":"Addressed are fundamental issues related to the reliability of three key optoelectronic devices for long-wavelength fiberoptic communications: InGaAsP LEDs, lasers, and PIN detectors. Degradation modes associated with metallization, crystal growth, device structure, and passivation materials are discussed. It is shown that with proper burn-in and screening, highly reliable devices can be manufactured.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67954","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Addressed are fundamental issues related to the reliability of three key optoelectronic devices for long-wavelength fiberoptic communications: InGaAsP LEDs, lasers, and PIN detectors. Degradation modes associated with metallization, crystal growth, device structure, and passivation materials are discussed. It is shown that with proper burn-in and screening, highly reliable devices can be manufactured.<>
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