Integrated 32 × 32 pyroelectric ir sensor array in nmos/jfet circuitry using highly (001) oriented pzt thin films on epitaxial y-al2o3/si substrates

N. Kawazu, K. Kikuchi, D. Akai, K. Sawada, M. Ishida
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引用次数: 1

Abstract

Integrated 32 × 32 pyroelectric IR sensor array in nMOS/JFET circuitry using highly (001) oriented Pb(Zr0.4, Ti0.6)O3 (PZT) thin films on epitaxial y-Al2O3/Si substrates has been fabricated on the one chip. The sensor array utilizes a sol-gel deposited PZT(001) thin film as a pyroelectric material, an n-JFET as a low noise detection device, and a micromachined membrane supported by four beams as a thermal isolation structure on epitaxial Pt(001)/y-Al2O3(001)/Si(001) substrates.
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在nmos/jfet电路中集成32 × 32热释电红外传感器阵列,在外延y-al2o3/si衬底上使用高度(001)取向的pzt薄膜
采用高(001)取向Pb(Zr0.4, Ti0.6)O3 (PZT)薄膜,在y-Al2O3/Si外延衬底上,在单芯片上制备了集成32 × 32热释电红外传感器阵列。传感器阵列采用溶胶-凝胶沉积的PZT(001)薄膜作为热释电材料,n-JFET作为低噪声检测器件,以及由四束支撑的微机械薄膜作为外延Pt(001)/y-Al2O3(001)/Si(001)衬底上的热隔离结构。
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