{"title":"A compact built-in current sensor for I/sub DDQ/ testing","authors":"Y. Tsiatouhas, T. Haniotakis, D. Nikolos","doi":"10.1109/OLT.2000.856619","DOIUrl":null,"url":null,"abstract":"In this paper a simple to implement, compact, build-in current sensor for I/sub DDQ/ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line I/sub DDQ/ testing.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OLT.2000.856619","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this paper a simple to implement, compact, build-in current sensor for I/sub DDQ/ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line I/sub DDQ/ testing.
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