A. Rukosuev, A. Alexandrov, A. Kudryashov, V. Samarkin
{"title":"Fast adaptive optical system for laser beam correction","authors":"A. Rukosuev, A. Alexandrov, A. Kudryashov, V. Samarkin","doi":"10.1109/CAOL.2010.5634230","DOIUrl":null,"url":null,"abstract":"Considered adaptive optical system is intended for correction of laser wavefornt aberrations, having characteristic frequency 50–70 Hz. The system consists of the following basic elements: stacked-actuators adaptive mirror, fast Shack-Hartmann wavefront sensor and a control system which includes computer under OS Windows and the fast control unit for adaptive mirror. The results of modeling of the correction process are presented and the interrelation between frequency of samples and accuracy of correction is revealed. Recommendations about future improvement of the system work are given.","PeriodicalId":254986,"journal":{"name":"2010 International Conference on Advanced Optoelectronics and Lasers","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Advanced Optoelectronics and Lasers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAOL.2010.5634230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Considered adaptive optical system is intended for correction of laser wavefornt aberrations, having characteristic frequency 50–70 Hz. The system consists of the following basic elements: stacked-actuators adaptive mirror, fast Shack-Hartmann wavefront sensor and a control system which includes computer under OS Windows and the fast control unit for adaptive mirror. The results of modeling of the correction process are presented and the interrelation between frequency of samples and accuracy of correction is revealed. Recommendations about future improvement of the system work are given.
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