Analysis of Optical Properties of Epitaxial PLZT Thin Films

M. Echizen, T. Kosaka, D. Fukunaga, T. Nishida, K. Uchiyama, T. Shiosaki
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Abstract

La-doped lead zirconate titanate (PLZT) has been applied to electro-optic (E-O) devices. We grew epitaxial PLZT thin films on alpha-Al2O3(012) single crystalline substrates fabricated by the conventional and the new sol-gel process. From result of observation by spectrophotometer, refractive index n approximately equal, were unaffected by processes. However, the average oscillator strength was different.
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外延PLZT薄膜光学特性分析
镧掺杂锆钛酸铅(PLZT)已被应用于电光器件中。我们在α - al2o3(012)单晶衬底上生长了外延PLZT薄膜。从分光光度计的观察结果来看,折射率n近似相等,不受工艺的影响。然而,振荡器的平均强度是不同的。
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