Temperature sensitivity to node spacing in ASTAP finite difference modelling for flat cap single- and multi-chip modules

K.J. Arbeitman
{"title":"Temperature sensitivity to node spacing in ASTAP finite difference modelling for flat cap single- and multi-chip modules","authors":"K.J. Arbeitman","doi":"10.1109/STHERM.1993.225328","DOIUrl":null,"url":null,"abstract":"Examines the sensitivity of ASTAP (Advanced Statistical Analysis Program) chip temperatures to model mesh size (node spacing) for flat cap single- and multichip modules and develops guidelines for mesh size selection which ensure a certain level of model accuracy without wasting resources with unnecessary model complication. Temperature output from models generated with the ASTAP model preprocessor (AMP) are first verified against the results from a finite-element modeling package. ASTAP chip temperatures as a function of node spacing are plotted. Optimum node spacing is determined as being where chip temperature variability decreases below the order of a user-defined value for all chips on a module. Guidelines are recommended for the most efficient mesh size selection as a function of module size, maximum chip power density, and maximum vertical chip attach 1D thermal resistances on the module.<<ETX>>","PeriodicalId":369022,"journal":{"name":"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1993.225328","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Examines the sensitivity of ASTAP (Advanced Statistical Analysis Program) chip temperatures to model mesh size (node spacing) for flat cap single- and multichip modules and develops guidelines for mesh size selection which ensure a certain level of model accuracy without wasting resources with unnecessary model complication. Temperature output from models generated with the ASTAP model preprocessor (AMP) are first verified against the results from a finite-element modeling package. ASTAP chip temperatures as a function of node spacing are plotted. Optimum node spacing is determined as being where chip temperature variability decreases below the order of a user-defined value for all chips on a module. Guidelines are recommended for the most efficient mesh size selection as a function of module size, maximum chip power density, and maximum vertical chip attach 1D thermal resistances on the module.<>
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
温度敏感性节点间距在ASTAP有限差分模型的平帽单和多芯片模块
检查ASTAP(高级统计分析程序)芯片温度对平盖单芯片和多芯片模块模型网格尺寸(节点间距)的敏感性,并制定网格尺寸选择指南,确保一定程度的模型精度,而不会浪费不必要的模型复杂性资源。由ASTAP模型预处理器(AMP)生成的模型的温度输出首先与有限元建模包的结果进行验证。绘制了ASTAP芯片温度随节点间距的函数图。最佳节点间距被确定为芯片温度变异性降低到模块上所有芯片的用户定义值以下的顺序。作为模块尺寸,最大芯片功率密度和模块上最大垂直芯片附加1D热阻的函数,建议使用最有效的网格尺寸选择指南。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Thermal resistance, thermomechanical stress and thermal cycling endurance of silicon chips bonded with adhesives Thermal and electrical resistances of bolted joints between plates of unequal thickness Electrically measuring the peak channel temperature of power GaAs MESFET Experimental characterization of board conduction sheets Methodology for the thermal characterization of the MQUAD microelectronic package
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1