A functional approach to delay faults test generation for sequential circuits

Abstract

In this paper we present an analysis of the coverage of delay faults in sequential circuits by a functional test pattern generator. Relationships are investigated between a functional fault model and delay faults, with correlations to the stuck-at fault coverage. Undetected faults are identified and an algorithm to improve the delay fault coverage is proposed. The final approach generates a functional test for sequential circuits with optimization and reaches complete coverage of detectable delay faults with short tests.<>