{"title":"Dynamic Diode Mixer Damage Measurements","authors":"R. Garver, C. Fazi, H. Bruns","doi":"10.1109/MWSYM.1985.1132031","DOIUrl":null,"url":null,"abstract":"An experiemntal setup has been developed which permits the progressive degradation of a mixer to be observed while it is being exposed to high-power-microwave pulses at a low repetition rate.","PeriodicalId":446741,"journal":{"name":"1985 IEEE MTT-S International Microwave Symposium Digest","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1985 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1985.1132031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
An experiemntal setup has been developed which permits the progressive degradation of a mixer to be observed while it is being exposed to high-power-microwave pulses at a low repetition rate.
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