{"title":"Outage analysis of two-way AF relaying systems with imperfect CSI and multiple interferers over Nakagami-m fading channels","authors":"Y. Long, Yuanyuan Gao, Mingxi Guo, G. Zang","doi":"10.1109/ICIST.2014.6920534","DOIUrl":null,"url":null,"abstract":"In this paper, the joint effect of both imperfect channel state information (CSI) and co-channel interference (CCI) on the dual-hop two-way amplify-and-forward relaying system (AF TWRS) is investigated. Assuming a Nakagami-m fading environment, we firstly obtain the effective end-to-end signal-to-interference plus noise ratio (SINR) expressions and then derive the closed-form approximate expression for the overall outage probability. Monte Carlo simulations verify the tightness of our approximation with the exact outage probability.","PeriodicalId":306383,"journal":{"name":"2014 4th IEEE International Conference on Information Science and Technology","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 4th IEEE International Conference on Information Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIST.2014.6920534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
In this paper, the joint effect of both imperfect channel state information (CSI) and co-channel interference (CCI) on the dual-hop two-way amplify-and-forward relaying system (AF TWRS) is investigated. Assuming a Nakagami-m fading environment, we firstly obtain the effective end-to-end signal-to-interference plus noise ratio (SINR) expressions and then derive the closed-form approximate expression for the overall outage probability. Monte Carlo simulations verify the tightness of our approximation with the exact outage probability.
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