{"title":"A new BIST approach for delay fault testing","authors":"A. Vuksic, K. Fuchs","doi":"10.1109/EDTC.1994.326863","DOIUrl":null,"url":null,"abstract":"A new built-in self testing (BIST) method for the detection of delay faults is proposed. It is shown that all possible pattern pairs can be generated with a MISR using all input combinations. In order to reduce the test pattern set, deterministic delay test generation is used and a minimal set of input vectors is derived via clique covering. Experimental results show that by just using the all-0 and all-1 input vectors, the non-robust path delay fault coverage ranges from 85% to 100%.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326863","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28
Abstract
A new built-in self testing (BIST) method for the detection of delay faults is proposed. It is shown that all possible pattern pairs can be generated with a MISR using all input combinations. In order to reduce the test pattern set, deterministic delay test generation is used and a minimal set of input vectors is derived via clique covering. Experimental results show that by just using the all-0 and all-1 input vectors, the non-robust path delay fault coverage ranges from 85% to 100%.<>
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