{"title":"Cost-effective approach to improve EMI yield loss","authors":"Hsuan-Chung Ko, Deng-Yao Chang, Cheng-Nan Hu","doi":"10.1109/TEST.2009.5355696","DOIUrl":null,"url":null,"abstract":"This work proposes a novel ATE test approach to decrease RF testing yield loss. Background noise of the system-under-test is surveyed based on a prototype load-board equipped with a PCB antenna system to analyze the correlation between the test data and background noise in order to identify the root causes of yield loss. Experimental results of RF testing in the EMI environment correlate well with a low yield mass production scenario that is estimated to address the EMI issue.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355696","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This work proposes a novel ATE test approach to decrease RF testing yield loss. Background noise of the system-under-test is surveyed based on a prototype load-board equipped with a PCB antenna system to analyze the correlation between the test data and background noise in order to identify the root causes of yield loss. Experimental results of RF testing in the EMI environment correlate well with a low yield mass production scenario that is estimated to address the EMI issue.
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