Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles

Abstract

This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) SRAM-based FPGA. Experimental results showing Single Event Upsets (SEUs) on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are provided and discussed. Shapes of multiple events (of various multiplicities) are also analyzed, as well as their dependency with the incident angle of the particle beam against the device's surface.