{"title":"Lock-in thermography for the localization of prebreakdown leakage current on power diodes","authors":"M. Riccio, A. Irace, G. Breglio","doi":"10.1109/RME.2009.5201357","DOIUrl":null,"url":null,"abstract":"In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.","PeriodicalId":245992,"journal":{"name":"2009 Ph.D. Research in Microelectronics and Electronics","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Ph.D. Research in Microelectronics and Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RME.2009.5201357","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
