M. Khazhinsky, K. Domanski, Guido Quax, Scott Ruth, F. Farbiz, N. Trivedi, H. Gossner
{"title":"EDA approaches in identifying latchup risks","authors":"M. Khazhinsky, K. Domanski, Guido Quax, Scott Ruth, F. Farbiz, N. Trivedi, H. Gossner","doi":"10.1109/EOSESD.2016.7592552","DOIUrl":null,"url":null,"abstract":"In this paper we review latchup protection verification methods and EDA challenges. We demonstrate complex static and transient latchup scenarios requiring advanced connectivity analysis. Using various EDA verification flows and tools we study latchup problems associated with grounded n-wells, biased n-wells and parasitic thyristors formed during ESD events.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592552","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper we review latchup protection verification methods and EDA challenges. We demonstrate complex static and transient latchup scenarios requiring advanced connectivity analysis. Using various EDA verification flows and tools we study latchup problems associated with grounded n-wells, biased n-wells and parasitic thyristors formed during ESD events.
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