TID Radiation Effects of 1Gb COTS NOR Flash Memories for the ESA JUICE Mission

S. Vargas-Sierra, B. Tanios, J.J. González-Luján, F. Tilhac, M. Domínguez, C. Poivey
{"title":"TID Radiation Effects of 1Gb COTS NOR Flash Memories for the ESA JUICE Mission","authors":"S. Vargas-Sierra, B. Tanios, J.J. González-Luján, F. Tilhac, M. Domínguez, C. Poivey","doi":"10.1109/radecs47380.2019.9745698","DOIUrl":null,"url":null,"abstract":"This work presents the comparative study of the TID radiation sensitivity of three COTS NOR Flash memories for the ESA JUpiter ICy moons Explorer (JUICE) Mission.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/radecs47380.2019.9745698","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This work presents the comparative study of the TID radiation sensitivity of three COTS NOR Flash memories for the ESA JUpiter ICy moons Explorer (JUICE) Mission.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
欧空局JUICE任务中1Gb COTS NOR闪存的TID辐射效应
本文对欧空局木星冰卫星探测器(JUICE)任务中三种COTS NOR闪存的TID辐射灵敏度进行了比较研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
CLASS: on-Chip Lightweight Accurate SEU/SET event claSSifier Approach for Defining Internal Electrostatic Discharge Design Environment of a Jovian Mission TID test results of radiation hardened SiC MOS structures The RADECS 2019 Short Course Circuit-Level Hardening Techniques to Mitigate Soft Errors in FinFET Logic Gates
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1