Array Module Connector Test Program at Unisys

R. Kuntz, S. Williams
{"title":"Array Module Connector Test Program at Unisys","authors":"R. Kuntz, S. Williams","doi":"10.1109/ICMCM.1994.753596","DOIUrl":null,"url":null,"abstract":"Interconnection of multichip modules to their next higher assembly (normally a printed wiring board) has the same set of problems the industry has always had to manage, however, some of the problems have been exacerbated in today's applications. Performance requirements are getting tighter as modules now operate at 100 megahertz and up. With an increasing size of the modules, the mismatch in the thermal coefficient of expansion (TCE) between the module and the printed wiring board induces more stress. This manifests itself in reliability problems '%\" the module has soldered terminations.","PeriodicalId":363745,"journal":{"name":"Proceedings of the International Conference on Multichip Modules","volume":"173 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Multichip Modules","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMCM.1994.753596","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Interconnection of multichip modules to their next higher assembly (normally a printed wiring board) has the same set of problems the industry has always had to manage, however, some of the problems have been exacerbated in today's applications. Performance requirements are getting tighter as modules now operate at 100 megahertz and up. With an increasing size of the modules, the mismatch in the thermal coefficient of expansion (TCE) between the module and the printed wiring board induces more stress. This manifests itself in reliability problems '%" the module has soldered terminations.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Unisys阵列模块连接器测试程序
多芯片模块与其下一个更高的组件(通常是印刷布线板)的互连具有行业一直必须管理的相同问题,然而,一些问题在今天的应用中已经加剧。性能要求越来越严格,因为模块现在工作在100兆赫以上。随着模块尺寸的增加,模块与印刷线路板之间的热膨胀系数(TCE)的不匹配会产生更大的应力。这体现在可靠性问题“%”模块有焊接端子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Volume Implementation of MCM-D Based Cache SRAM Products for Workstation and PC Applications Evaluation of Ionic Salt Photodefinable Polyimides As Mcm-D Dielectrics with Copper Metallization An Application Strategy for Scm-L and Mcm-L Using High Density Laminate Technologies Integrated Flex: Rigid-Flex Capability in a High Performance Mcm Multichip module technologies for high-speed ATM switching systems
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1