Aivar Urkunov, P. Korolev, I. Ivanov, S. Polesskiy, A. Sosnin, K. Sedov
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Abstract
The study reviews and analyzes three mathematical models of operational failure rates given in dependability handbooks for thin-film precision resistors used in radioelectronic devices. Besides, the mathematical models of mode factor and basic failure rate are analyzed. Based on experimental data of temperature coefficient of resistance, resistance shift and basic machine learning methods the refined mathematical model of mode coefficient is formed, taking into account the extended temperature range.
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