{"title":"A Calibration Method for De-Embedding a Microwave Test Fixture","authors":"S. Rosenbaum, O. Pitzalis, J. Marzan","doi":"10.1109/ARFTG.1986.323670","DOIUrl":null,"url":null,"abstract":"A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"691 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1986.323670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.
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