Pub Date : 1986-06-05DOI: 10.1109/ARFTG.1986.323670
S. Rosenbaum, O. Pitzalis, J. Marzan
A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.
{"title":"A Calibration Method for De-Embedding a Microwave Test Fixture","authors":"S. Rosenbaum, O. Pitzalis, J. Marzan","doi":"10.1109/ARFTG.1986.323670","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323670","url":null,"abstract":"A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"691 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121990357","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323676
J. Ashley
Since I use the word "phasor" where t r a d i t i o n uses "vector" , some c o m n t s on terminology are p e r t i n e n t . My 1950 course i n AC c i r c u i t ana lys i s d i d use the word "vector" along w i t h drawings c a l l e d "vec to r diagrams". As f i e l d theo ry courses were added t o the EE curriculum, vec to r was a l s o needed fo r space vec to r analys is . The c i r c u i t t heo ry courses coined the word "phasor" t o rep lace vector .
因为我用了“相量”这个词，在这里，t是一个矢量，而t是一个矢量，所以我用了“矢量”这个词。我1950我当然n AC c r c u我t安娜赖氨酸s d d使用这个词“向量”w i t h图纸c l l e d“矢量r图”。如果在EE课程中添加了所有的技术课程，那么对空间技术的分析就需要对空间技术进行分析。c是c，它是c，但它是在这门课程创造了“相量”这个词来表示向量。
{"title":"Speed Comparisons for Reflection Coefficient Measurement Methods","authors":"J. Ashley","doi":"10.1109/ARFTG.1986.323676","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323676","url":null,"abstract":"Since I use the word \"phasor\" where t r a d i t i o n uses \"vector\" , some c o m n t s on terminology are p e r t i n e n t . My 1950 course i n AC c i r c u i t ana lys i s d i d use the word \"vector\" along w i t h drawings c a l l e d \"vec to r diagrams\". As f i e l d theo ry courses were added t o the EE curriculum, vec to r was a l s o needed fo r space vec to r analys is . The c i r c u i t t heo ry courses coined the word \"phasor\" t o rep lace vector .","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127077517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323672
Chia-lun J. Hu
Three-probe microwave automatic impedance measuring system has been designed and used in many places. The principle of this system is similar to that of the six-port systems. But because of the simplicity of the three-probe theories. It is possible to realized the design of the three-probe system by using only analog circuits as reported in IEEE Trasactions on MTT as well as in the ARFTG conferences. The main advantage of this analog system is its real time measurement capacity. That is, it can measure and track in real time the variations of the real and the imaginary parts of the unknown complex impedance when this impedance is varying in real time. In this article, the author wish to report to the audience some experimental results of real-time tracking comparison measurements. These results were obtained by using simultaneously an HP 8410 automatic network analyzer and the current three-probe system. The 8410 is used with data taken directly from its analog output without going through its digital processing part. The quantitative difference between these two measured results is seen to be within a few percents while the qualitative variations of the two are exactly the same. The digitally treated outputs from any commercial network analyzer are usually more accurate but they are not measured continuously in real time. That is, it may not capture many important features of the varying unknown impedance when the impedance is varying very fast in real time.
三探头微波阻抗自动测量系统已经设计并应用于许多地方。该系统的原理与六端口系统相似。但是因为三探针理论的简单性。根据IEEE transactions on MTT和ARFTG会议的报告，仅使用模拟电路就可以实现三探头系统的设计。该模拟系统的主要优点是其实时测量能力。即当未知复阻抗实时变化时，可以实时测量和跟踪该未知复阻抗实部和虚部的变化。在本文中，作者希望向读者报告一些实时跟踪对比测量的实验结果。这些结果是在HP 8410自动网络分析仪和当前三探针系统同时使用时得到的。8410使用的数据直接从其模拟输出，而不经过其数字处理部分。这两种测量结果之间的定量差异被认为在几个百分点之内，而两者的定性变化完全相同。任何商用网络分析仪的数字处理输出通常更准确，但它们不是实时连续测量的。也就是说，当阻抗实时变化非常快时，它可能无法捕捉到变化的未知阻抗的许多重要特征。
{"title":"Real Time Tracking Measurements of a Time-Varying Comlex Impedance at K-Band Using Three Fixed Probes","authors":"Chia-lun J. Hu","doi":"10.1109/ARFTG.1986.323672","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323672","url":null,"abstract":"Three-probe microwave automatic impedance measuring system has been designed and used in many places. The principle of this system is similar to that of the six-port systems. But because of the simplicity of the three-probe theories. It is possible to realized the design of the three-probe system by using only analog circuits as reported in IEEE Trasactions on MTT as well as in the ARFTG conferences. The main advantage of this analog system is its real time measurement capacity. That is, it can measure and track in real time the variations of the real and the imaginary parts of the unknown complex impedance when this impedance is varying in real time. In this article, the author wish to report to the audience some experimental results of real-time tracking comparison measurements. These results were obtained by using simultaneously an HP 8410 automatic network analyzer and the current three-probe system. The 8410 is used with data taken directly from its analog output without going through its digital processing part. The quantitative difference between these two measured results is seen to be within a few percents while the qualitative variations of the two are exactly the same. The digitally treated outputs from any commercial network analyzer are usually more accurate but they are not measured continuously in real time. That is, it may not capture many important features of the varying unknown impedance when the impedance is varying very fast in real time.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131261622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323665
L. Dunleavy, P. Katehi
Connection repeatability is a critical issue for millimeter-wave de-embedding. Regardless of the de-embedding scheme, the electrical connections made to standards used for fixture characterization must be repeatable and similar to those made to the device under test. Key repeatability issues related to the measurement of microstrip discontinuities with the "TSD" (thru-short-delay) technique are discussed. These include the repeatability of coax/microstrip connections, microstrip/microstrip interconnects, microstrip line fabrication and substrate mounting, and the electrical characteristics of coax-to-microstrip transitions (launchers). Each of these issues has been explored experimentally and the results are presented for two types of coaxial-to-microstrip test fixtures: one usable from 2 to 18GHz, and the other from 2 to 40GHz.
{"title":"Repeatability Issues for De-Embedding Microstrip Discontinuity S-Parameter Measurements by the TSD Technique","authors":"L. Dunleavy, P. Katehi","doi":"10.1109/ARFTG.1986.323665","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323665","url":null,"abstract":"Connection repeatability is a critical issue for millimeter-wave de-embedding. Regardless of the de-embedding scheme, the electrical connections made to standards used for fixture characterization must be repeatable and similar to those made to the device under test. Key repeatability issues related to the measurement of microstrip discontinuities with the \"TSD\" (thru-short-delay) technique are discussed. These include the repeatability of coax/microstrip connections, microstrip/microstrip interconnects, microstrip line fabrication and substrate mounting, and the electrical characteristics of coax-to-microstrip transitions (launchers). Each of these issues has been explored experimentally and the results are presented for two types of coaxial-to-microstrip test fixtures: one usable from 2 to 18GHz, and the other from 2 to 40GHz.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126875273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323661
G. Bright, R. Macior, H. Schuman
Procedures are needed for accurate and efficient testing of large quantities of microwave amplifier/digital phase shifter devices under a wide variety of signal and environment conditions. Pulsed conditions, in particular, preclude the use of conventional automatic network analyzers. A method is investigated for applying direct detection (no local oscillator) I/Q detectors to obtain accurate phase measurements without the need for leveling input signals. The investigation focuses on identifying the minimum amount of measured calibration data required to reduce uncertainties in measured phase to less than 1°. A mathematical model of the device is developed that contains parameters that can be defined from a limited amount of calibration data. Once defined, the model then can be used to determine the device error for a wide range of signal amplitudes and phases. Data obtained with an Anaren phase discriminator is presented as an illustration of the method.
{"title":"Coherent (I/Q) Detector Performance Under Extended Drive Signal Conditions","authors":"G. Bright, R. Macior, H. Schuman","doi":"10.1109/ARFTG.1986.323661","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323661","url":null,"abstract":"Procedures are needed for accurate and efficient testing of large quantities of microwave amplifier/digital phase shifter devices under a wide variety of signal and environment conditions. Pulsed conditions, in particular, preclude the use of conventional automatic network analyzers. A method is investigated for applying direct detection (no local oscillator) I/Q detectors to obtain accurate phase measurements without the need for leveling input signals. The investigation focuses on identifying the minimum amount of measured calibration data required to reduce uncertainties in measured phase to less than 1°. A mathematical model of the device is developed that contains parameters that can be defined from a limited amount of calibration data. Once defined, the model then can be used to determine the device error for a wide range of signal amplitudes and phases. Data obtained with an Anaren phase discriminator is presented as an illustration of the method.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122880625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323671
E. Strid
An equation is given for theoretical errors in oneport corrected vector S-parameter measurements (in any transmission media). The error analysis is used to investigate parasitics peculiar to planar impedance standards. Experimental results verify the error analysis, and show that parasitics as small as 5 pH are repeatably measurable. Application to GaAsFET measurements through 26 GHz is discussed.
{"title":"Planar Impedance Standards and Accuracy Considerations in Vector Network Analysis","authors":"E. Strid","doi":"10.1109/ARFTG.1986.323671","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323671","url":null,"abstract":"An equation is given for theoretical errors in oneport corrected vector S-parameter measurements (in any transmission media). The error analysis is used to investigate parasitics peculiar to planar impedance standards. Experimental results verify the error analysis, and show that parasitics as small as 5 pH are repeatably measurable. Application to GaAsFET measurements through 26 GHz is discussed.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123865129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323668
J. Rautio, R. Harrington
The precise analysis of microstrip circuits at microwave and millimeter wave frequencies has become critically important in the design of monolithic microwave GaAs integrated circuits. This is because the usual post-fabrication 'tweaking' of circuit response is rarely feasible and the resulting lengthy repeated design modifications drive design costs to unacceptable levels. This paper will describe a Galerkin method of moments analysis for microstrip circuits of arbitrary planar geometry enclosed in a rectangular conducting box. The technique entails a time-harmonic electromagnetic analysis evaluating all fields and surface currents. This analysis is suitable for the accurate verification of designs prior to fabrication. Thus any necessary modifications may be made quickly and inexpensively. A computer program has been written in Pascal on an IBM-PC and preliminary results will be presented.
{"title":"Preliminary Results of a Time-Harmonic Electromagnetic Analysis of Shielded Microstrip Circuits","authors":"J. Rautio, R. Harrington","doi":"10.1109/ARFTG.1986.323668","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323668","url":null,"abstract":"The precise analysis of microstrip circuits at microwave and millimeter wave frequencies has become critically important in the design of monolithic microwave GaAs integrated circuits. This is because the usual post-fabrication 'tweaking' of circuit response is rarely feasible and the resulting lengthy repeated design modifications drive design costs to unacceptable levels. This paper will describe a Galerkin method of moments analysis for microstrip circuits of arbitrary planar geometry enclosed in a rectangular conducting box. The technique entails a time-harmonic electromagnetic analysis evaluating all fields and surface currents. This analysis is suitable for the accurate verification of designs prior to fabrication. Thus any necessary modifications may be made quickly and inexpensively. A computer program has been written in Pascal on an IBM-PC and preliminary results will be presented.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115114851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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