{"title":"Controllability and observability measures for functional-level testability evaluation","authors":"M. Jamoussi, B. Kaminska","doi":"10.1109/VTEST.1993.313332","DOIUrl":null,"url":null,"abstract":"An approach of a functional-level testability evaluation, based on controllability and observability measures (c.o.m.), is proposed. Using Rutman's system model, ordinary applied at the gate level, c.o.m are extended to the data-path level, to permit incorporation of testability constraints in the high-level synthesis stage. The approach of computing these c.o.m. is based on the reduced ordered binary decision diagram (ROBDD) circuit representation. It is shown how to identify untestable parts of a data path and how to evaluate its test cost. The insertion of a two-variable multiplexor, as a structural modification in the data path, is suggested to improve the c.o.m., and so, the test cost. To evaluate the impact of this transformation on the data-path testability, an objective function is proposed, appropriate for high-level synthesis.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
An approach of a functional-level testability evaluation, based on controllability and observability measures (c.o.m.), is proposed. Using Rutman's system model, ordinary applied at the gate level, c.o.m are extended to the data-path level, to permit incorporation of testability constraints in the high-level synthesis stage. The approach of computing these c.o.m. is based on the reduced ordered binary decision diagram (ROBDD) circuit representation. It is shown how to identify untestable parts of a data path and how to evaluate its test cost. The insertion of a two-variable multiplexor, as a structural modification in the data path, is suggested to improve the c.o.m., and so, the test cost. To evaluate the impact of this transformation on the data-path testability, an objective function is proposed, appropriate for high-level synthesis.<>