Fatigue performance of Cu/Sn–3.0Ag–0.5Cu/Cu solder joints at different current densities

Long-geng Liu, Bo Wang, Wangyun Li, Yu-bing Gong, K. Pan
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Abstract

In this study, the low cycle shear fatigue performance and fracture behavior of microscale ball grid array (BGA) structure Cu/Sn–3.0Ag–0.5Cu/Cu solder joints with various shear amplitudes were systematically investigated at different current densities by experimental, theoretical methods and finite element analysis. The experimental results showed that the fatigue life of the solder joint decreased with increasing shear amplitude and current density. The descent rate of fatigue life decreased with increasing shear amplitude at the same current density. Moreover, the deterioration of current stressing on the fatigue life of the solder joint was more serious at the lower shear amplitude. In addition, with increasing current density, the solder joint fracture position transitioned from the solder matrix to the solder/IMC layer interface, and the shape of the fracture path shifted from arc-shape to flat-shape.
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Cu/ Sn-3.0Ag-0.5Cu /Cu焊点在不同电流密度下的疲劳性能
本文通过实验、理论和有限元分析等方法,系统研究了不同剪切幅值的微尺度球栅阵列(BGA)结构Cu/ Sn-3.0Ag-0.5Cu /Cu焊点在不同电流密度下的低周剪切疲劳性能和断裂行为。实验结果表明,随着剪切幅值和电流密度的增大,焊点的疲劳寿命减小。在相同电流密度下,随剪切幅值的增大,疲劳寿命下降速率减小。在较低剪切幅值下,电流应力的恶化对焊点疲劳寿命的影响更为严重。此外,随着电流密度的增大,焊点断口位置由钎料基体过渡到钎料/IMC层界面,断口路径由圆弧型转变为平面型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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