Integrated logic - Static induction transistor logic

J. Nishizawa, B. Wilamowski
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引用次数: 11

Abstract

SOLID-STATE CIRCUITS are designed to minimize both delay time and operational power. The product of these is thought t o be constant, represented by a specific figure for each type of integrated circuit. The 12L structure has been shown to operate with the lowest switching energy’. The power efficiency of the Vertical Injection Logic (VIL) structure shows a further improvement, by a factor of two. However, its fabrication requires the use of 7-8 masks’. A new logic circuit structure is proposed Static Induction Transistor Logic (SITL) utilizing the static induction transistor ( SIT)3. This logic circuit permits a further reduction in the power-delay time product (theoretically 6 x and experimentally, one order of magnitude). In the case of 12L, it is made by a 3 or 4-mask technology. The packing density can be as high as 1000 gates/cm2. In this logic structure, the SITS are used as the output transistors and the lateral bipolar PNP transistor is used as the injector, as usual, as shown in Figure 1. The SIT consists of Nt drains on the top surface of the Nepitaxial layer, a Pt gate configured on both sides of the drain on the same surface and the space charge layer formed surrounding the drain regions, Nchannels penetrating the gate region below the drains and the N+ source substrate. The channels are about 2-3 p m in diamcter and are formed by lateral P-type diffusion. The fabrication process in this case is as follows. The Nepitaxial layer is grown on the N+ substrate, having a carrier concentration of 2-3 x 1013 cm-3 and a thickness of 4-5 pm. After oxidation and photolithography, B-diffused layers were formed as the gate regions of the SIT and the emitter of the injector (the lateral transistor), followed by the second oxidation. Then, the Nf -diffusion layers are formed as drain regions, followed by the opening of contact holes in the Si02 film, using the third photolithography. After A1 evaporation, the A1 film is selectively etched, and the ring oscillator formed, as shown in Figure 2.
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集成逻辑-静态感应晶体管逻辑
固态电路被设计成最小化延迟时间和工作功率。它们的乘积被认为是恒定的,每种类型的集成电路都用一个特定的数字来表示。12L结构已被证明以最低的开关能量运行。垂直注入逻辑(VIL)结构的功率效率进一步提高了两倍。然而,它的制造需要使用7-8个掩模。提出了一种利用静电感应晶体管(SIT)3的新型逻辑电路结构——静电感应晶体管逻辑(SITL)。该逻辑电路允许进一步降低功率延迟时间积(理论上为6倍,实验上为一个数量级)。在12L的情况下,它是由3或4掩模技术。包装密度可高达1000门/平方厘米。在这种逻辑结构中,sit用作输出晶体管,而侧双极PNP晶体管用作注入器,如图1所示。该SIT由位于Nepitaxial层顶部表面的Nt漏极、位于同一表面的漏极两侧的Pt栅极以及围绕漏极区域形成的空间电荷层、穿透漏极下方栅极区域的N通道以及N+源衬底组成。通道直径约为2 ~ 3 pm,由侧向p型扩散形成。本案例的制作流程如下:Nepitaxial层生长在N+衬底上,载流子浓度为2-3 × 1013 cm-3,厚度为4-5 pm。经过氧化和光刻,形成b扩散层,作为SIT的栅极区和注入器(侧晶体管)的发射极区,然后进行第二次氧化。然后,形成Nf扩散层作为漏极区,随后在二氧化硅薄膜上打开接触孔,使用第三次光刻。A1蒸发后,选择性蚀刻A1膜,形成环形振荡器,如图2所示。
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