Numerical Analysis of AIMD Lead Tolerances Using the Lead Electromagnetic Model

M. Kozlov, W. Kainz
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Abstract

Influence of lead tolerances on the RF-induced power deposition (P) near a lead electrode was analyzed using the lead electromagnetic model and two sets of incident electric fields (Etan) with different profiles. Our results indicate that tolerance analysis shall be done for all lead lengths and clinically relevant Etan because the sensitivity of P to a given variation of the lead properties can differ by an order of magnitude.
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基于引线电磁模型的AIMD引线公差数值分析
利用引线电磁模型和两组不同分布的入射电场(Etan),分析了铅容差对铅电极附近射频感应功率沉积(P)的影响。我们的结果表明,应该对所有导联长度和临床相关的Etan进行耐受性分析,因为P对导联性质的给定变化的敏感性可能会有一个数量级的差异。
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