Drift of charged defects in local fields as a mechanism of degradation in ferroelectrics

Y. Genenko, D. Lupascu
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Abstract

Two-dimensional model of point defect migration in ferroelectrics is advanced. Charge defect drift-diffusion in local depolarization fields is considered as a mechanism for aging in ferroelectrics. Numerical results are given for the coupled problems of point defect transport and electrostatic field relaxation in a 2D domain configuration. Peak values of the clamping pressure at domain walls due to space charge formation are in the range of 1divide10 MPa and the consequent coercive field is in the range of 1 kV/mm in agreement with observed coercive stresses and fields in bulk perovskite ferroelectrics.
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局部电场中带电缺陷漂移作为铁电体退化机制
提出了铁电体中点缺陷迁移的二维模型。局部去极化场中电荷缺陷漂移扩散被认为是铁电体老化的一种机制。给出了二维结构中点缺陷输运和静电场弛豫耦合问题的数值结果。在畴壁处由于空间电荷形成的夹紧压力峰值在1 / 10mpa范围内,由此产生的矫顽力场在1 kV/mm范围内,这与观察到的大块钙钛矿铁电体的矫顽力和场一致。
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