{"title":"Charged cable—system ESD event","authors":"P. Tamminen, T. Viheriakoski","doi":"10.1109/EOSESD.2016.7592559","DOIUrl":null,"url":null,"abstract":"A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A charged electronic system failed while it was connected to a USB port. The resulting discharge current waveform had a sub-nanosecond initial peak that bypassed on-board protection devices. In this study the ESD stress waveform is analyzed with simulation and measurement methods.
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