Rex Petersen, P. Pant, Pablo Lopez, Aaron Barton, Jim Ignowski, Doug Josephson
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引用次数: 44
Abstract
Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.
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