{"title":"The Small-Signal Model Comparison and Analysis between AlGaN/GaN FinFETs and HEMTs on the Same Wafer","authors":"Liu Wang, Jun Liu, Wenyong Zhou","doi":"10.1109/CICTA.2018.8706092","DOIUrl":null,"url":null,"abstract":"In this letter, we proposed the small-signal models of AlGaN/GaN fin-shaped field-effect transistors (FinFETs) and AlGaN/GaN high electron mobility transistors (HEMTs). The parasitic parameters of device been extracted from small signal model, respectively. The comparisons of parasitic parameters and S-parameters between planer and 3D GaN device also are shown in this work.","PeriodicalId":186840,"journal":{"name":"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICTA.2018.8706092","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this letter, we proposed the small-signal models of AlGaN/GaN fin-shaped field-effect transistors (FinFETs) and AlGaN/GaN high electron mobility transistors (HEMTs). The parasitic parameters of device been extracted from small signal model, respectively. The comparisons of parasitic parameters and S-parameters between planer and 3D GaN device also are shown in this work.