Prediction of the robustness of integrated circuits against EFT/BURST

S. Bauer, B. Deutschmann, G. Winkler
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引用次数: 8

Abstract

Ensuring product immunity against transient disturbances, that are present in the electromagnetic environment, is important to guarantee the electromagnetic compatibility (EMC) of an electronic system. Therefore, being able to predict whether a transient event interferes with the normal functionality of the electronic system and causes a malfunction, or even destruction, can help to define the right protection during the concept and development phase of the system. In this paper, a methodology predicated on the exploitation of different techniques to perform mathematical calculations and simulations that are based on models of electrical fast transients (EFT) together with the corresponding model of the real test setup is presented. This methodology can be used to estimate the interference of an integrated circuit (IC) by a transient event during the test and to predict to what extent the IC will survive sustain without getting damaged. This method can also be used to determine the optimal external and internal protection structure for an electronic system against any kind of transient disturbance.
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集成电路对EFT/BURST的鲁棒性预测
电磁环境中存在的瞬态干扰是保证电子系统电磁兼容性的重要因素。因此,能够预测瞬态事件是否会干扰电子系统的正常功能并导致故障,甚至破坏,可以帮助在系统的概念和开发阶段定义正确的保护。本文提出了一种基于电快速瞬变(EFT)模型和实际测试装置的相应模型,利用不同技术进行数学计算和仿真的方法。该方法可用于估计测试过程中瞬态事件对集成电路(IC)的干扰,并预测IC在不损坏的情况下存活的程度。该方法还可用于确定电子系统抵御各种瞬态扰动的最佳外部和内部保护结构。
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