Novel numerical method to correct for both circuit distortions and passive layers effect affecting Sawyer-Tower ferroelectric thin films hysteresis measurements

R. Bouregba, G. Poullain
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Abstract

A novel approach is proposed to compute the ferroelectric polarization by correcting numerically for both parasitic disturbing S-T hysteresis measurements and possible interfacial layers. This is achieved by taking into account all the charges flowing in a S-T circuit.
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采用一种新的数值方法对影响索耶-塔铁电薄膜迟滞测量的电路畸变和无源层效应进行校正
提出了一种计算铁电极化的新方法,通过对寄生干扰S-T滞回测量和可能的界面层进行数值校正。这是通过考虑在S-T电路中流动的所有电荷来实现的。
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