Possibility of SOI based super steep subthreshold slope MOSFET for ultra low voltage application

Takayuki Mori, J. Ida
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引用次数: 3

Abstract

Ultra Low Power (ULP) LSI's require the steep subthreshold slope (SS) MOSFET. However, the theoretical SS limit of the conventional MOSFET is 60mV/dec at the room temperature. Recently, devices which have the less than 60mV/dec SS, such as the Tunnel FET (TFET) and the Impact Ionization MOS (I-MOS), have been studied. In addition to those, the steep SS MOSFET's using the Floating-Body (FB) SOI have been proposed. In this work, we report our finding of the FB and the Body-Tied (BT) SOI MOSFET with the super steep SS (<; 1mV/Dec) characteristics with the 0.15um SOI. We also discuss the possibility of it as a switching device for the ultra low voltage application, where we consider that the three points are the issues to improve; reducing the operation voltage, increasing Ion/Ioff ratios which also pay attention keeping the low Ioff, controlling hysteresis characteristics.
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基于SOI的超陡亚阈斜率MOSFET超低电压应用的可能性
超低功耗(ULP) LSI需要陡的亚阈值斜率(SS) MOSFET。然而,在室温下,传统MOSFET的理论SS极限为60mV/dec。近年来,人们研究了功率小于60mV/dec的器件,如隧道场效应管(TFET)和冲击电离MOS (I-MOS)。此外,还提出了采用浮体(FB) SOI的陡坡SS MOSFET。在这项工作中,我们报告了我们的发现FB和体系(BT) SOI MOSFET具有超陡SS (<;1mV/Dec)特性与0.15um SOI。我们还讨论了它作为超低电压应用的开关器件的可能性,其中我们认为这三点是有待改进的问题;降低工作电压,提高离子/开关比,同时注意保持低开关,控制迟滞特性。
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