A. V. Goor, G. Gaydadjiev, V. Yarmolik, V. G. Mikitjuk
{"title":"March LA: a test for linked memory faults","authors":"A. V. Goor, G. Gaydadjiev, V. Yarmolik, V. G. Mikitjuk","doi":"10.5555/787260.787737","DOIUrl":null,"url":null,"abstract":"This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.","PeriodicalId":297301,"journal":{"name":"Proceedings European Design and Test Conference. ED & TC 97","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"34","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings European Design and Test Conference. ED & TC 97","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5555/787260.787737","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 34
Abstract
This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.