M. Shayesteh, C. Daunt, D. O'Connell, V. Djara, M. White, B. Long, R. Duffy
{"title":"N-type doped germanium contact resistance extraction and evaluation for advanced devices","authors":"M. Shayesteh, C. Daunt, D. O'Connell, V. Djara, M. White, B. Long, R. Duffy","doi":"10.1109/ESSDERC.2011.6044191","DOIUrl":null,"url":null,"abstract":"The authors extract contact resistivity of NiGe layers on phosphorus-doped and arsenic-doped germanium, using the Transfer Length Method. It is shown experimentally that higher implant dose yields lower contact resistivity. Furthermore phosphorus is a better choice of dopant in terms of contact resistance and sheet resistance at low activation anneal temperatures, such as 500 °C. The impact of high contact resistance is evaluated for 22 nm technology NMOS germanium devices and beyond.","PeriodicalId":161896,"journal":{"name":"2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2011.6044191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The authors extract contact resistivity of NiGe layers on phosphorus-doped and arsenic-doped germanium, using the Transfer Length Method. It is shown experimentally that higher implant dose yields lower contact resistivity. Furthermore phosphorus is a better choice of dopant in terms of contact resistance and sheet resistance at low activation anneal temperatures, such as 500 °C. The impact of high contact resistance is evaluated for 22 nm technology NMOS germanium devices and beyond.