{"title":"Kirk effect limitations in high voltage IC's","authors":"A. Ludikhuize","doi":"10.1109/ISPSD.1994.583734","DOIUrl":null,"url":null,"abstract":"The voltage handling capability of Resurf LDMOS and of junction isolated islands in HV IC's is observed to decrease at high current density. This is attributed to the Kirk effect.","PeriodicalId":405897,"journal":{"name":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"86","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1994.583734","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 86
Abstract
The voltage handling capability of Resurf LDMOS and of junction isolated islands in HV IC's is observed to decrease at high current density. This is attributed to the Kirk effect.