Thermosonic flip-chip bonding using longitudinal ultrasonic vibration

Q. Tan, Wenge Zhang, B. Schaible, L. Bond, T. Ju, Y.C. Lee
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引用次数: 53

Abstract

Flip-chip assembly is an important technology for first level electronic packaging. Among different assembly approaches, thermosonic bonding is becoming an attractive choice because it is cost-effective. To increase the bonding capability for high I/O assembly, a novel longitudinal bonding system is developed in this study. This bonding system has two advantages over the transverse bonding system: it overcomes the planarity problem and simplifies bonding tool configuration. During the development, an end-effector is designed with rigorous considerations of ultrasonic wave propagation, bonding force and co-planarity between the chip holder and hot stage. The bonding system is then characterized to make sure that it is suitable for flip-chip assembly. This bonding technology is proven successful by mechanical bonding tests as well as a functional CMOS/SRAM module demonstration. During the bonding process, the chip is under longitudinal ultrasonic "hammering". However, there is no apparent damage because the impact stress is low due to the low ultrasonic vibration amplitude.
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利用纵向超声振动的热超声倒装芯片键合
倒装芯片组装是一级电子封装的一项重要技术。在不同的组装方法中,热超声键合正成为一种有吸引力的选择,因为它具有成本效益。为了提高高I/O装配的粘接能力,本研究开发了一种新型的纵向粘接系统。与横向键合系统相比,该键合系统具有两个优点:克服了平面性问题,简化了键合工具的配置。在开发过程中,严格考虑了超声波传播、粘合力以及芯片支架与热工作台之间的共平面度,设计了末端执行器。然后对键合系统进行表征,以确保它适用于倒装芯片组装。这种键合技术通过机械键合测试以及功能性CMOS/SRAM模块演示证明是成功的。在粘接过程中,芯片受到纵向超声“锤击”。但由于超声振动幅度小,冲击应力小,没有明显的损伤。
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