{"title":"Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method","authors":"W. Jin, R. Xu","doi":"10.1109/ICCPS.2015.7454230","DOIUrl":null,"url":null,"abstract":"We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.","PeriodicalId":319991,"journal":{"name":"2015 IEEE International Conference on Communication Problem-Solving (ICCP)","volume":"137 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Communication Problem-Solving (ICCP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCPS.2015.7454230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.
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