Forming Patch Functions and Combinational Circuit Rectification

A. Matrosova, S. Chernyshov, G. Goshin, D. Kudin
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引用次数: 1

Abstract

Increasing chips complexity originates a problem of providing their 100% correct fabrication. During chip fabrication logical bugs may be detected, changes of specification may appear and so on. There are some ways of recovering chips to provide functioning we need. One of them is connected with using Engineering Change Order (ECO) technique. In the frame of this technique forming of patch functions is based on using internal nodes of implemented circuit Ci (circuit that has to be corrected). Methods are oriented to cut calculations of patch functions with using SAT and QBS solvers and cut overhead. Functions of implemented circuit Ci and specification circuit Cs, as a rule, are essentially different. Our approach is oriented to slight difference between specification circuit Cs and implemented circuit Ci. We suggest using special miter system represented by list of products with their special characteristics. Our approach does not demand using SAT and QBS solvers. For correction we use only inputs and outputs of implemented circuit Ci. In contrast with current approaches there is no need using internal nodes of the implemented circuit.
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形成补片函数和组合电路整流
增加芯片的复杂性产生了提供100%正确制造的问题。在芯片制造过程中,可能会发现逻辑错误,可能会出现规格变化等等。有一些方法可以恢复芯片来提供我们需要的功能。其中之一与工程变更单(ECO)技术的应用有关。在这种技术的框架中,补丁函数的形成是基于使用已实现电路Ci(必须被纠正的电路)的内部节点。方法是利用SAT和QBS求解器和削减开销来减少patch函数的计算。实现电路Ci和规范电路Cs的功能通常有本质区别。我们的方法是针对规格电路c和实现电路Ci之间的细微差异。我们建议使用特殊的人字系统,用产品的特殊特性清单来表示。我们的方法不需要使用SAT和QBS求解器。为了校正,我们只使用实现电路Ci的输入和输出。与目前的方法相比,不需要使用所实现电路的内部节点。
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