{"title":"Thermal annealing of AuPt Schottky contacts on GaAs and AlGaAs","authors":"P. Machac","doi":"10.1109/ASDAM.2000.889469","DOIUrl":null,"url":null,"abstract":"The thermal stability of AuPt Schottky contacts on n-GaAs and n-AlGaAs epitaxial layers is investigated. The thermal treatment has been carried out by RTA apparatus for 45 s up to 615/spl deg/C. The AuPt Schottky contacts on GaAs are found to remain thermally stable after annealing up to 520/spl deg/C, the optimal parameters have been obtained at 415/spl deg/C. The present example shows the possibility to use the Schottky contacts as MSM photodetectors with the sensitivity of 1.7 A/W. The AuPt metallization at the AlGaAs wafers has shown poor parameters.","PeriodicalId":303962,"journal":{"name":"ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.2000.889469","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The thermal stability of AuPt Schottky contacts on n-GaAs and n-AlGaAs epitaxial layers is investigated. The thermal treatment has been carried out by RTA apparatus for 45 s up to 615/spl deg/C. The AuPt Schottky contacts on GaAs are found to remain thermally stable after annealing up to 520/spl deg/C, the optimal parameters have been obtained at 415/spl deg/C. The present example shows the possibility to use the Schottky contacts as MSM photodetectors with the sensitivity of 1.7 A/W. The AuPt metallization at the AlGaAs wafers has shown poor parameters.
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GaAs和AlGaAs上AuPt Schottky触点的热退火
研究了n-GaAs和n-AlGaAs外延层上AuPt肖特基触点的热稳定性。用RTA仪对其进行热处理,温度为615/spl℃,热处理时间为45s。结果表明,GaAs上的AuPt Schottky触点在520/spl℃退火后仍保持热稳定性,在415/spl℃退火时获得了最佳参数。本例显示了使用肖特基触点作为MSM光电探测器的可能性,其灵敏度为1.7 A/W。AlGaAs晶片上的AuPt金属化表现出较差的参数。
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