{"title":"Single reference continuous rate clock and data recovery from 30 Mbit/s to 3.2 Gbit/s","authors":"J. Frambach, R. Heijna, R. Krosschell","doi":"10.1109/CICC.2002.1012847","DOIUrl":null,"url":null,"abstract":"Today's networks encompass a myriad of bit rates, both new appearing rates as well as legacy ones. To cover all these bit rates, a continuous rate chip-set was developed, containing a continuous rate clock and data recovery, capable of recovering any bit rate between 30 Mbit/s and 3.2 Gbit/s. While using only one single reference frequency, a frequency acquisition loop, based on a fractional-N divider and a frequency window detector, provides 4.8 Hz frequency resolution. A built-in PRBS generator provides for high frequency testing.","PeriodicalId":209025,"journal":{"name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2002.1012847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Today's networks encompass a myriad of bit rates, both new appearing rates as well as legacy ones. To cover all these bit rates, a continuous rate chip-set was developed, containing a continuous rate clock and data recovery, capable of recovering any bit rate between 30 Mbit/s and 3.2 Gbit/s. While using only one single reference frequency, a frequency acquisition loop, based on a fractional-N divider and a frequency window detector, provides 4.8 Hz frequency resolution. A built-in PRBS generator provides for high frequency testing.