{"title":"Investigation on effectiveness of series gate resistor in CDM ESD protection designs","authors":"Y. Zhou, A. Righter, J. Hajjar","doi":"10.1109/ASICON.2013.6811976","DOIUrl":null,"url":null,"abstract":"The impact of gate series resistor on CDM protection effectiveness is systematically evaluated using SPICE simulation and verified with a modified VF-TLP test method. It is shown that the effectiveness of the resistor to a MOS input device is highly dependent on the size of the protected MOS device as well as on the types of ESD protection circuits. Larger MOS devices require smaller resistance values than smaller devices.","PeriodicalId":150654,"journal":{"name":"2013 IEEE 10th International Conference on ASIC","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 10th International Conference on ASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASICON.2013.6811976","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The impact of gate series resistor on CDM protection effectiveness is systematically evaluated using SPICE simulation and verified with a modified VF-TLP test method. It is shown that the effectiveness of the resistor to a MOS input device is highly dependent on the size of the protected MOS device as well as on the types of ESD protection circuits. Larger MOS devices require smaller resistance values than smaller devices.
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