Design and Test of a Complex Mcm Product

W. Blood, A. Flint
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引用次数: 2

Abstract

A family of high performance, computer oriented multichip module (MCM) products is being developed to provide the building blocks for advanced, high density computer systems. Each MCM is a system level building block that interfaces to other family members through compatible processor and memory busses. By selecting and interconnecting the various MGM blocks, it is possible to configure a variety of high speed, cache coherent, multiprocessing computer designs. The use of multichip modules is necessary to meet system performance and size requirements. This paper focuses on a specific member of the MGM family, a 4M word by 40 bit Dynamic Random Access Memory (DRAM). Special attention is given to product requirements, design methodology, and test strategy. MCM testing is sufficiently complex that test must be an integral part of the complete module design process.
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复杂Mcm产品的设计与测试
一系列高性能、面向计算机的多芯片模块(MCM)产品正在开发中,为先进的高密度计算机系统提供构建模块。每个MCM都是一个系统级构建块,通过兼容的处理器和内存总线与其他家族成员连接。通过选择和互连各种MGM块,可以配置各种高速、缓存一致、多处理的计算机设计。为了满足系统性能和尺寸要求,必须使用多芯片模块。本文主要研究MGM家族的一个特定成员——4M字× 40位动态随机存取存储器(DRAM)。特别关注产品需求,设计方法和测试策略。MCM测试非常复杂,因此测试必须是整个模块设计过程中不可或缺的一部分。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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