Advanced fault-tolerance techniques for a color digital camera-on-a-chip

I. Koren, Z. Koren, G. Chapman
{"title":"Advanced fault-tolerance techniques for a color digital camera-on-a-chip","authors":"I. Koren, Z. Koren, G. Chapman","doi":"10.1109/DFTVS.2001.966746","DOIUrl":null,"url":null,"abstract":"Color digital imagers contain red, green and blue subpixels within each color pixel. Defects that develop either at fabrication time or due to environmentally induced errors over time can cause a single color subpixel (e.g., R) to fail, while leaving the remaining colors intact. This paper investigates seven software correction algorithms that interpolate the color of a pixel based on its nearest neighbors. Using several measurements of color error, all seven methods were investigated for a large number of digital images. Interpolations using only information from the single failed color (e.g., R) in the neighbors gave the poorest results. Those using all color measurements and a quadratic interpolation formula, combined with the remaining subpixel colors (e.g., G and B) produced significantly better results. A formula developed using the CIE color coordinates of tristimulus values (X, Y, Z) yielded the best results.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966746","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

Color digital imagers contain red, green and blue subpixels within each color pixel. Defects that develop either at fabrication time or due to environmentally induced errors over time can cause a single color subpixel (e.g., R) to fail, while leaving the remaining colors intact. This paper investigates seven software correction algorithms that interpolate the color of a pixel based on its nearest neighbors. Using several measurements of color error, all seven methods were investigated for a large number of digital images. Interpolations using only information from the single failed color (e.g., R) in the neighbors gave the poorest results. Those using all color measurements and a quadratic interpolation formula, combined with the remaining subpixel colors (e.g., G and B) produced significantly better results. A formula developed using the CIE color coordinates of tristimulus values (X, Y, Z) yielded the best results.
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片上彩色数码相机的先进容错技术
彩色数字成像仪在每个颜色像素中包含红、绿、蓝子像素。在制造时产生的缺陷或由于环境引起的错误随着时间的推移会导致单个颜色亚像素(例如,R)失效,而其余颜色完好无损。本文研究了基于最近邻插值像素颜色的七种软件校正算法。采用几种测量的颜色误差,研究了所有七种方法的大量数字图像。仅使用邻居中单个失败颜色(例如R)的信息进行插值会得到最差的结果。那些使用所有颜色测量和二次插值公式,结合剩余的亚像素颜色(例如,G和B)产生明显更好的结果。使用三刺激值(X, Y, Z)的CIE颜色坐标开发的公式产生了最佳结果。
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