On-Line Testing of Lab-on-Chip Using Digital Microfluidic Compactors

2008 14th IEEE International On-Line Testing Symposium Pub Date : 2008-07-07 DOI:10.1109/IOLTS.2008.45

Yang Zhao, K. Chakrabarty

引用次数: 6

Abstract

Dependability is an important system attribute for microfluidic lab-on-chip devices. On-line testing offers a promising method for detecting defects, fluidic abnormalities, and bioassay malfunctions during chip operation. However, previous techniques for reading test outcomes and analyzing pulse sequences are cumbersome, sensitive to the calibration of capacitive sensors, and error-prone. We present a built-in self-test (BIST) method for on-line testing of digital microfluidic lab-on-chip. This method utilizes microfluidic compactors based on droplet-based AND gates, which are implemented using digital microfluidics. Dynamic reconfiguration of these compactors ensures low area overhead and it allows BIST to be interleaved with bioassays in functional mode.

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基于数字微流控压实机的芯片实验室在线测试

可靠性是微流控芯片实验室设备的重要系统属性。在线测试为检测芯片运行过程中的缺陷、流体异常和生物测定故障提供了一种很有前途的方法。然而，以前读取测试结果和分析脉冲序列的技术是繁琐的，对电容传感器的校准敏感，并且容易出错。提出了一种内置自检(BIST)方法，用于数字微流控芯片实验室的在线测试。该方法利用基于液滴与门的微流控压实器，该压实器采用数字微流控技术实现。这些压实机的动态重新配置确保了低面积开销，并允许BIST在功能模式下与生物测定交叉。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2008 14th IEEE International On-Line Testing Symposium

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