Error Analysis in Fast Near Field Probing by the Modulated Scattering Technique

J. Bolomey, D. Picard
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引用次数: 2

Abstract

This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.
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调制散射快速近场探测中的误差分析
本文讨论了利用调制散射技术工作的线性阵列的测量精度。与全机械扫描解决方案相比,在线快速电子扫描与被测天线旋转的结合大大缩短了近场探测持续时间。数值模拟了耦合、制造公差和元件色散的影响。
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