{"title":"Error Analysis in Fast Near Field Probing by the Modulated Scattering Technique","authors":"J. Bolomey, D. Picard","doi":"10.1109/EUMA.1983.333202","DOIUrl":null,"url":null,"abstract":"This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.