Junsik Park, Jong-Sung Lee, Seongmoo Kim, Cheolgu Jo, Byongsu Seol, Jingook Kim
{"title":"Measurement of discharging currents through an IC due to the charged board event using a shielded Rogowski coil","authors":"Junsik Park, Jong-Sung Lee, Seongmoo Kim, Cheolgu Jo, Byongsu Seol, Jingook Kim","doi":"10.1109/EOSESD.2016.7592537","DOIUrl":null,"url":null,"abstract":"The discharging currents through an IC induced by the charged board event (CBE) is measured using a shielded Rogowski coil. Several shielding techniques are applied in the measurement to reduce the common mode noise and the unexpected electric field coupling. The measured results are validated with the CBE circuit simulations.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"521 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The discharging currents through an IC induced by the charged board event (CBE) is measured using a shielded Rogowski coil. Several shielding techniques are applied in the measurement to reduce the common mode noise and the unexpected electric field coupling. The measured results are validated with the CBE circuit simulations.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
