Electrical ageing of polyethylene during constant AC stress

P. Rohl, K. Nissen, W. Rose
{"title":"Electrical ageing of polyethylene during constant AC stress","authors":"P. Rohl, K. Nissen, W. Rose","doi":"10.1109/ICSD.1989.69160","DOIUrl":null,"url":null,"abstract":"The authors investigated the ageing of polyethylene under inhomogeneous electric fields well below the intrinsic breakdown field strength (>570 kV/mm RMS) but above a local critical field strength at which charge injection takes place. They observed partial discharge and the treeing behavior under different conditions of AC and DC stressing. Additional experiments with samples impregnated with an electronegative gas (SF/sub 6/) yielded further information on the process of polymer degradation. The results show that there is no deterioration during DC ageing; the polarity reversal that occurs under AC stressing is necessary for the ageing process. The observation of brittle walls of the tree structure indicates that the rate of impingement of hot electrons on the polymer is relatively low. Therefore the heat produced may be easily dissipated without appreciable rise of the temperature within the treed region. The experiments with the impregnated samples are in agreement with the assumption of a hot electron process. The SF/sub 6/ captures hot electrons and therefore reduces the probability of damage; in the present case no deterioration is observable up to 600 h.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The authors investigated the ageing of polyethylene under inhomogeneous electric fields well below the intrinsic breakdown field strength (>570 kV/mm RMS) but above a local critical field strength at which charge injection takes place. They observed partial discharge and the treeing behavior under different conditions of AC and DC stressing. Additional experiments with samples impregnated with an electronegative gas (SF/sub 6/) yielded further information on the process of polymer degradation. The results show that there is no deterioration during DC ageing; the polarity reversal that occurs under AC stressing is necessary for the ageing process. The observation of brittle walls of the tree structure indicates that the rate of impingement of hot electrons on the polymer is relatively low. Therefore the heat produced may be easily dissipated without appreciable rise of the temperature within the treed region. The experiments with the impregnated samples are in agreement with the assumption of a hot electron process. The SF/sub 6/ captures hot electrons and therefore reduces the probability of damage; in the present case no deterioration is observable up to 600 h.<>
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恒定交流应力下聚乙烯的电老化
作者研究了聚乙烯在非均匀电场下的老化,远低于固有击穿场强(>570 kV/mm RMS),但高于发生电荷注入的局部临界场强。他们观察了不同交直流应力条件下的局部放电和树形行为。对浸渍了电负性气体(SF/sub 6/)的样品进行了进一步的实验,得到了聚合物降解过程的进一步信息。结果表明:直流老化过程中无劣化现象;在交流应力下发生的极性反转是老化过程所必需的。对树状结构脆性壁的观察表明,热电子对聚合物的撞击率相对较低。因此,产生的热量可以很容易地消散,而不会在树木区域内出现明显的温度上升。用浸渍试样进行的实验符合热电子过程的假设。SF/sub 6/捕获热电子,因此降低了损坏的可能性;在这种情况下,在600小时内没有观察到劣化。
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