Friedrich zur Nieden, K. Esmark, Stefan Seidl, R. Gartner
{"title":"Predict the product specific CDM stress using measurement-based models of CDM discharge heads","authors":"Friedrich zur Nieden, K. Esmark, Stefan Seidl, R. Gartner","doi":"10.1109/EOSESD.2016.7592542","DOIUrl":null,"url":null,"abstract":"The introduction of the CDM Joint Standard has an impact on the electrical properties of the tester hardware due to updated waveform requirements. Models of different CDM discharge heads are generated using measurement data in frequency domain. Discharge currents of a device are simulated according to the different standards in time domain. In comparison to the popular but replaced JEDEC standard peak current levels have increased.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"163 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The introduction of the CDM Joint Standard has an impact on the electrical properties of the tester hardware due to updated waveform requirements. Models of different CDM discharge heads are generated using measurement data in frequency domain. Discharge currents of a device are simulated according to the different standards in time domain. In comparison to the popular but replaced JEDEC standard peak current levels have increased.
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