I. Raghavendra, Satish Naik Banavath, T. Sreekanth
{"title":"H-bridge Based Bidirectional Z-Source DC Circuit Breaker with Improved Device Stress and Automatic Reclosing Capability","authors":"I. Raghavendra, Satish Naik Banavath, T. Sreekanth","doi":"10.1109/IECON48115.2021.9589108","DOIUrl":null,"url":null,"abstract":"DC microgrid is gaining more popularity due to the advent and advancements in renewable energy sources, however, there are some challenges in its development such as protection of dc equipment from short-circuit faults. This paper proposes a modified solid-state dc circuit breaker for bidirectional power flow protection that reduces current stress on semiconductor devices during commissioning and reclosing. And also a method of system re-breaking or reclosing depending on the fault existence has been proposed. This circuit breaker topology has been verified with varying system parameters using the spice simulation tool. The protection of dc system by the proposed circuit breaker is experimentally verified for a system rating of 100V/10A.","PeriodicalId":443337,"journal":{"name":"IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society","volume":"291 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IECON48115.2021.9589108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
DC microgrid is gaining more popularity due to the advent and advancements in renewable energy sources, however, there are some challenges in its development such as protection of dc equipment from short-circuit faults. This paper proposes a modified solid-state dc circuit breaker for bidirectional power flow protection that reduces current stress on semiconductor devices during commissioning and reclosing. And also a method of system re-breaking or reclosing depending on the fault existence has been proposed. This circuit breaker topology has been verified with varying system parameters using the spice simulation tool. The protection of dc system by the proposed circuit breaker is experimentally verified for a system rating of 100V/10A.